METHOD AND APPARATUS FOR DETECTION OF FLAW,申请号JP19940068825-传众专利搜索

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发明名称	METHOD AND APPARATUS FOR DETECTION OF FLAW
摘要
申请公布号	JPH07208959(A)	申请公布日期	1995.08.11
申请号	JP19940068825	申请日期	1994.04.06
申请人	TOPPAN PRINTING CO LTD	发明人	WATANABE YUKIO
分类号	G01B11/30;G01N21/88;G01N21/93;(IPC1-7):G01B11/30	主分类号	G01B11/30
代理机构		代理人
主权项
地址

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