发明名称 METHOD FOR USING MATERIAL OF LOW DIELECTRIC CONSTANT IN MANUFACTURE OF INTEGRATED CIRCUIT
摘要 PURPOSE: To cure a final structure and to minimize crosstalks by coating an integrated circuit with a low specific-dielectric-constant material and heating it in an atmosphere. CONSTITUTION: This low specific-dielectric-constant material 34 is applied over the top surface of an integrated circuit device 10 to form a passivation oxide film 30 on the surface. Then the structure is cured through a heat treatment. After the curing, a photomasking and etching step is carried out. This is performed for opening areas in an SOG layer 34 and the passivation oxide film layer 30 for making a connection from a package to the integrated circuit device 10. Then resist emulsion is removed. Lastly, the integrated circuit device 10 is annealed to remove damages and defects present in a gate oxide film. Consequently, crosstalks can be minimized.
申请公布号 JPH07201875(A) 申请公布日期 1995.08.04
申请号 JP19940304653 申请日期 1994.12.08
申请人 A T & T GLOBAL INF SOLUTIONS INTERNATL INC 发明人 DERIRU DEII JIEI OORUMAN;KENESU PII FUTSUKUSU;GEIRU DABURIYUU MIRAA;SAMUERU SHII JIOIA
分类号 H01L21/768;H01L21/316;H01L21/324;H01L21/822;H01L23/14;H01L23/31;H01L23/522;H01L27/04;(IPC1-7):H01L21/324 主分类号 H01L21/768
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