发明名称 |
METHOD FOR USING MATERIAL OF LOW DIELECTRIC CONSTANT IN MANUFACTURE OF INTEGRATED CIRCUIT |
摘要 |
PURPOSE: To cure a final structure and to minimize crosstalks by coating an integrated circuit with a low specific-dielectric-constant material and heating it in an atmosphere. CONSTITUTION: This low specific-dielectric-constant material 34 is applied over the top surface of an integrated circuit device 10 to form a passivation oxide film 30 on the surface. Then the structure is cured through a heat treatment. After the curing, a photomasking and etching step is carried out. This is performed for opening areas in an SOG layer 34 and the passivation oxide film layer 30 for making a connection from a package to the integrated circuit device 10. Then resist emulsion is removed. Lastly, the integrated circuit device 10 is annealed to remove damages and defects present in a gate oxide film. Consequently, crosstalks can be minimized. |
申请公布号 |
JPH07201875(A) |
申请公布日期 |
1995.08.04 |
申请号 |
JP19940304653 |
申请日期 |
1994.12.08 |
申请人 |
A T & T GLOBAL INF SOLUTIONS INTERNATL INC |
发明人 |
DERIRU DEII JIEI OORUMAN;KENESU PII FUTSUKUSU;GEIRU DABURIYUU MIRAA;SAMUERU SHII JIOIA |
分类号 |
H01L21/768;H01L21/316;H01L21/324;H01L21/822;H01L23/14;H01L23/31;H01L23/522;H01L27/04;(IPC1-7):H01L21/324 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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