发明名称 DRY PEEL DEVELOPMENT TYPE PHOTORESIST AND METHOD FOR DEVELOPING SAME
摘要 PURPOSE:To enable a two-layered dry peel development type photoresist compris ing positive and negative photoresists to exhibit its regist characteristic to a maximum and to eliminate the need for disposing of waste liquid such as a developer by exposing the photoresist, and peeling the same for development. CONSTITUTION:A substrate l is laminated with a negative dry film 2, and a positive photoresist 3 is applied to the film 2, and after preliminary heating, the photoresist 3 is laminated with a base film 4. A photomask 5 is placed on the base film 4 for UV radiation 6. A heat treatment is carried out to bond a resist-forming part (the exposed part of the negative dry film)2a to the substrate 1 and to bond the unexposed part 2b of the negative dry film which serves as a peeling layer to the unexposed and exposed parts of the positive photoresist. The unexposed part 2b of the negative dry film which serves as a peeling layer is peeled for development, together with a cover film. Further, a resist pattern 7 is formed on the substrate 1 by post-curing.
申请公布号 JPH07199456(A) 申请公布日期 1995.08.04
申请号 JP19930334375 申请日期 1993.12.28
申请人 SUMITOMO BAKELITE CO LTD 发明人 HOZUMI TAKESHI
分类号 G03F7/004;G03F7/095;G03F7/26;G03F7/34;G03F7/38;H05K3/06;(IPC1-7):G03F7/004 主分类号 G03F7/004
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