发明名称 |
METHOD OF FORMING PATTERN |
摘要 |
forming a photoresist layer on a substrate having a step; exposing using a first mask; exposing hte thicker step portion using a second mask; and developing. The second mask pattern has a dimension adjusted according to the thickness of the photoresist and depth of the step; it has a size 0.5-400 micron along the step portion. The exposure energy of the second step is 5-20% of that of the first step. The method enhances an pattern profile at the step portion, and simplifies the manufacturing process |
申请公布号 |
KR950008384(B1) |
申请公布日期 |
1995.07.28 |
申请号 |
KR19930003210 |
申请日期 |
1993.03.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HAK;HAN, U - SONG |
分类号 |
G03F7/26;G03F7/20;H01L21/027 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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