发明名称 METHOD OF FORMING PATTERN
摘要 forming a photoresist layer on a substrate having a step; exposing using a first mask; exposing hte thicker step portion using a second mask; and developing. The second mask pattern has a dimension adjusted according to the thickness of the photoresist and depth of the step; it has a size 0.5-400 micron along the step portion. The exposure energy of the second step is 5-20% of that of the first step. The method enhances an pattern profile at the step portion, and simplifies the manufacturing process
申请公布号 KR950008384(B1) 申请公布日期 1995.07.28
申请号 KR19930003210 申请日期 1993.03.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HAK;HAN, U - SONG
分类号 G03F7/26;G03F7/20;H01L21/027 主分类号 G03F7/26
代理机构 代理人
主权项
地址