Non-volatile memory cell having hole confinement layer for reducing band-to-band tunneling

摘要

An arrangement for reducing the erratic operation of a non-volatile memory cell caused by the accumulation of holes at a specific location within the cell during the electrical erasing of the cell includes a layer of hole confinement material positioned at the specific location the holes accumulate for containing the holes in a specific area. The arrangement also includes an arrangement for removing the holes from the containment area. A method of reducing the erratic operation of a non-volatile memory cell caused by the accumulation of holes at a specific location within the cell during the electrical erasing of the cell includes the step of providing a layer of hole confinement material positioned at the specific location the holes accumulate for containing the holes in the layer of hole confinement material.