发明名称 High-density interconnect technique
摘要 A high density interconnect system (30) employs contact fingers (32) on both surfaces (34) and (36) of burn-in PCB (38), feed-through PCB (40) and driver PCB (42). Each of the PCBs (38), (40) and (42) has a card-edge connector (44), (46) and (48). The feed-through PCB (40) has a second card-edge connector (40) and a second set of contact fingers (32), since it mates with both the burn-in PCB (38) and the driver PCB (42). The contact fingers (32) and the card-edge connectors (44), (46), (48) and (50) of each PCB (38), (40) and (42) mate inversely with each other on adjacent PCBs, i.e., the card-edge connector (44) of the burn-in PCB (38) mates with the contact fingers (32) of the feed-through PCB (40), and the card-edge connector (46) of the feed-through PCB (40) mates with the contact fingers (32) of the burn-in PCB (38), for example. The same relationship exists between the card-edge connector (50) of the feed-through PCB (40), the card-edge connector (48) of the driver PCB (42) and the contact fingers (32) of the feed-through PCB(40) and the driver PCB (42).
申请公布号 US5429510(A) 申请公布日期 1995.07.04
申请号 US19930161282 申请日期 1993.12.01
申请人 AEHR TEST SYSTEMS, INC. 发明人 BARRACLOUGH, WILLIAM D.;ALPERIN, MIKHAIL A.;BREHM, JEFFREY A.;HOANG, JOHN D.;SHEPHERD, PATRICK M.;TOMIC, JAMES F.
分类号 A61K31/70;G01R31/28;H01R12/04;H01R12/16;H01R12/18;H01R12/20;H01R12/32;H05K1/14;(IPC1-7):H01R9/09 主分类号 A61K31/70
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