| 摘要 |
A method is described, in which a self-test is controlled in a subsystem of a data processing system. Control patterns are transported by the data processing system via a shift register and are then passed to the subsystem via connections used for normal control in the non-testing condition. A characterization of the test result is then loaded again into the shift register via connections also intended for normal use and is subsequently transported by the data processing system. A subsystem suitable for a self-test according to this method is controllable in the self-test condition from a shift register without it being necessary that it is provided with special test connections.
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