发明名称 |
MEMORY CELL AND MEMORY DEVICE |
摘要 |
PURPOSE:To realize a static memory cell having high resistance to soft error generated by alpha ray. CONSTITUTION:A memory cell 200 has a coupling capacitor Cc between two information storage nodes 1, 2. A p well (or p substrate), in which drive MOS transistors Mn5 and Mn4 and transfer MOS transistors Mn1 and Mn2 are formed, is connected to a Vbb generating circuit 210. The voltage Vbb is set lower than a low level VL of a signal potential of the memory cell. This causes a parasitic diode between the sources of MN1. to MN4 or a n type diffusion layer corresponding to a drain and the p well (or p substrate) not to be ON even when a potential fluctuation DELTAVL of the node 2 on the low potential side is large, thus preventing mal function. |
申请公布号 |
JPH07161844(A) |
申请公布日期 |
1995.06.23 |
申请号 |
JP19930311545 |
申请日期 |
1993.12.13 |
申请人 |
HITACHI LTD;HITACHI DEVICE ENG CO LTD |
发明人 |
IDEI YOJI;NANBU HIROAKI;KANETANI KAZUO;MASUDA TORU;YAMAGUCHI KUNIHIKO;OHATA KENICHI;KUSUNOKI TAKESHI |
分类号 |
G11C11/41;G11C11/412;H01L21/8244;H01L27/11 |
主分类号 |
G11C11/41 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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