发明名称 Method for forming contact plugs in integrated circuits
摘要 According to the present invention, a method is provided for forming contact vias in an integrated circuit. Initially, a first protective layer is formed on an insulating layer, and an opening is created through the insulating layer where a contact is to be made. A conductive layer is deposited over the protective layer and partially fills the opening, forming a conductive plug in the opening. A second protective layer is then formed over the conductive plug. Portions of the conductive layer which were formed over the first protective layer are removed. During removal of those portions of the conductive layer, the second protective layer protects the conductive plug from damage. The first and second protective layers are then removed, leaving the conductive plug in the opening in the insulating layer. A conductive contact can now be made by depositing a second conductive layer over the conductive plug.
申请公布号 US5423939(A) 申请公布日期 1995.06.13
申请号 US19930110486 申请日期 1993.08.23
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 BRYANT, FRANK R.;NGUYEN, LOI N.
分类号 H01L21/28;H01L21/768;(IPC1-7):B44C1/22 主分类号 H01L21/28
代理机构 代理人
主权项
地址