发明名称 BeTe-ZnSe graded band gap ohmic contact to p-type ZnSe semiconductors
摘要 The present invention relates to semiconductor devices with ohmic contact to ZnSe-based layers and lasers derived therefrom wherein BeTe is used in a graded band gap layer. Preferably, an ohmic contact layer of BeTe-containing graded composition is used which consists essentially of BexZn1-xTexSe1-x wherein x is within the range of 0 and 1 selected so as to provide substantial lattice matching to the lattice structure c the substrate. Specifically, BexZn1-xTexSe1-x graded gap semiconductor layers are provided for application as ohmic contacts to p-type ZnSe, ZnSxSe1-x, Zn1-xCdxS, Zn1-xCdxSySe1-y, Zn1-xMgxSySe1-y (wherein x and y are a number selected from 0 to 1) and other II-VI compound semiconductors used in lasers grown on GaAs substrates. Due to the close lattice match to GaAs substrate, graded (BeTe)x (ZnSe)1-x contact allow for the entire device structure to be grown within the pseudomorphic limit.
申请公布号 US5422902(A) 申请公布日期 1995.06.06
申请号 US19930087307 申请日期 1993.07.02
申请人 PHILIPS ELECTRONICS NORTH AMERICA CORPORATION 发明人 MENSZ, PIOTR M.
分类号 H01L33/00;H01L29/225;H01L29/45;H01S5/00;H01S5/042;H01S5/327;H01S5/347;(IPC1-7):H01S3/19 主分类号 H01L33/00
代理机构 代理人
主权项
地址