发明名称 TREATMENT DEVICE
摘要 PURPOSE:To improve product yield and to improve throughput by controlling a temperature of a treatment object which is cooled after heated. CONSTITUTION:A supporter 14 which projects and detracts from the upper surface of a mounting stand 12 and supports a wafer W is provided to the mounting stand 12 as a cooling means whereon a heated wafer W is mounted, and a supply path 16 which is connected to a cooling water supply source 18 is also provided thereto. A temperature of the wafer W supported by the supporter 14 is detected by a temperature sensor 30 and a detected signal thereof is transmitted to a CPU 40. A rising/lowering cylinder 19 is contracted on the basis of a control signal from the CPU 40 and the supporter 14 is contained inside the mounting stand 12 to mount the wafer W on the mounting stand 12. Thereby, it is possible to cool the heated wafer W after made to stand by until it becomes a specified temperature and to prevent cracks, etc., due to rapid cooling of the wafer W.
申请公布号 JPH07142377(A) 申请公布日期 1995.06.02
申请号 JP19930312538 申请日期 1993.11.18
申请人 TOKYO ELECTRON LTD;TOKYO ELECTRON KYUSHU KK 发明人 MURAKAMI MASAAKI
分类号 G03F7/26;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/26
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