发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To solve the problems on the element isolation caused by the selectivity of CVD by depositing a titanium oxide before the formation of platinum that becomes lower electrode, providing the titanium oxide at the bottom surface part of a groove, forming a high-dielectric-constant insulating film, and keeping the AC and DC electric insulation between neighboring electrodes. CONSTITUTION:A thin TiO2, layer 103 of about 10nm is provided between a lower capacitor electrode 104 and an active element layer 102 and on an interlayer insulating layer 102 for providing electric insulation between lower electrodes. A conductor plug 105, which is penetrated through the two layers 102 and 103 for electric connection, is arranged, and the conductance between a lower electrode 104 and an active element layer 101 is secured. A high dielectric-constant insulating film 601 is deposited by 50nm on this structure. Therefore, the high-dielectric-constant insulating film 601 a satisfies a stoichimmetry composition on platinum, and titanium atoms have the more excessive composition than the stoichmetry composition at the bottom surface of a groove. The non-stoichiometry composition film at the bottom surface becomes the film having the low dielectric constant and the high insulation, and the electric insulation between the neighboring electrodes is maintained.
申请公布号 JPH07142598(A) 申请公布日期 1995.06.02
申请号 JP19930283047 申请日期 1993.11.12
申请人 HITACHI LTD 发明人 MIKI HIROSHI
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L21/8246;H01L27/10;H01L27/105;H01L27/108 主分类号 H01L27/04
代理机构 代理人
主权项
地址