发明名称 Dry exhaust gas conditioning
摘要 A gas treatment method and apparatus for use in connection with processes of etching semiconductor devices or of plasma enhanced chemical vapor deposition onto semiconductor materials. In accordance with the method and apparatus, the exhaust gases are introduced into first and second stages while heating the first and second stages. The stages can be contained within a heated cartridge. The first stage contains silicon or a silicon-rich alloy or a silicon-rich substance in a particulate form and a partial coating of copper or a copper rich substance in intimate contact with the silicon, the silicon-rich alloy or the silicon-rich substance. The second stage contains calcium oxide, a calcium oxide containing material, or a soda lime containing medium.
申请公布号 US5417934(A) 申请公布日期 1995.05.23
申请号 US19930008936 申请日期 1993.01.26
申请人 BOC LIMITED 发明人 SMITH, JAMES R.;TIMMS, PETER L.
分类号 B01D53/34;B01D53/46;B01D53/54;B01D53/68;B01D53/86;C23C16/44;(IPC1-7):B01D53/00 主分类号 B01D53/34
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