发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To obtain a semiconductor device manufacturing method by which an air-bridge wiring and a via-hole wiring, which is located in the vicinity of the air-bridge wiring, can be formed simultaneously by one electroplating and the process of manufacture can be simplified sharply. CONSTITUTION:After the first resist film 117, having an air-bridge wiring pattern, has been formed, the first power feeding layer 13 is formed on the whole surface, and the first power feeding layer 13 and a substrate 1 are etched using the second resist film 118, having the pattern for via hole, as a mask, and a via hole 212a is formed. Then, the second power feeding layer 23 is formed, an electroplating is conducted using the third resist film 119, having the prescribed pattern, as a mask, and an air-bridge wiring and the wiring in the via hole are integrally formed.
申请公布号 JPH07135210(A) 申请公布日期 1995.05.23
申请号 JP19930280765 申请日期 1993.11.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 MATSUOKA TAKASHI
分类号 H01L21/288;C23C18/31;C25D5/02;C25D7/12;H01L21/3205;H01L21/768;H01L23/48;H01L23/482;H01L23/522;H01L23/532;(IPC1-7):H01L21/320 主分类号 H01L21/288
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