发明名称 HALFTONE-SYSTEM PHASE SHIFT MASK AND PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To provide such a halftone-system phase shift mask that a light- shielding zone can be formed in the same process and at the same time as forming a semi light-shielding region and that exposure light can be surely cut by the light-shielding zone. CONSTITUTION:This halftone-system phase shift mask 10 has a pattern region 16 consisting of a semi light-shielding zone 14 and a light-transmitting zone 12 comprising recessed part of the substrate 20. The phase of the light transmitting through the semi light-shielding zone 14 is different from the phase of the light transmitting through the light-transmitting zone 12. A light-shielding zone 30 is formed around the pattern region 16. This light-shielding zone 30 consists of a light-transmitting region 32 of the light-shielding zone comprising a recessed part of the substrate 20 and a semi lightshielding region 34 of the light-shielding zone alternately arranged. The phase of the light transmitting through the semi light-shielding region 34 is different from the phase of the light transmitting through the light-transmitting region 32.
申请公布号 JPH07134391(A) 申请公布日期 1995.05.23
申请号 JP19930174646 申请日期 1993.06.23
申请人 SONY CORP 发明人 SUGAWARA MINORU;KAWAHIRA HIROICHI
分类号 G03F1/32;G03F1/68;G03F1/80;H01L21/027 主分类号 G03F1/32
代理机构 代理人
主权项
地址