发明名称 |
HALFTONE-SYSTEM PHASE SHIFT MASK AND PRODUCTION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To provide such a halftone-system phase shift mask that a light- shielding zone can be formed in the same process and at the same time as forming a semi light-shielding region and that exposure light can be surely cut by the light-shielding zone. CONSTITUTION:This halftone-system phase shift mask 10 has a pattern region 16 consisting of a semi light-shielding zone 14 and a light-transmitting zone 12 comprising recessed part of the substrate 20. The phase of the light transmitting through the semi light-shielding zone 14 is different from the phase of the light transmitting through the light-transmitting zone 12. A light-shielding zone 30 is formed around the pattern region 16. This light-shielding zone 30 consists of a light-transmitting region 32 of the light-shielding zone comprising a recessed part of the substrate 20 and a semi lightshielding region 34 of the light-shielding zone alternately arranged. The phase of the light transmitting through the semi light-shielding region 34 is different from the phase of the light transmitting through the light-transmitting region 32. |
申请公布号 |
JPH07134391(A) |
申请公布日期 |
1995.05.23 |
申请号 |
JP19930174646 |
申请日期 |
1993.06.23 |
申请人 |
SONY CORP |
发明人 |
SUGAWARA MINORU;KAWAHIRA HIROICHI |
分类号 |
G03F1/32;G03F1/68;G03F1/80;H01L21/027 |
主分类号 |
G03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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