| 摘要 |
A semiconductor integrated circuit includes a plurality of data buses, and emitter-follower circuits arranged in the data buses. Read parts, which are coupled to the emitter-follower circuits, read data transferred via the data buses via the emitter-follower circuits. A test part, which is coupled to the emitter-follower circuits, determines, in a test mode, whether or not the data transferred via the data buses have an error and outputs a test output signal to one of the data buses. The output test signal has a potential level higher than that of the data transferred via the data buses in a normal mode. |
