| 摘要 |
The microwave section of a dual technology sensor comprising microwave and infrared sections may be periodically tested. This is done by arranging for the output of the microwave section to be monitored at times corresponding to microwave pulses and at times coresponding to no microwave pulses. If the microwave section is operating properly then a difference should be seen in the output between the "pulse" and "no pulse" times. Because this test can involve a change in the average energy output by the microwave section it can also affect the infrared section of the sensor which often inadvertently receives radiation from the microwave source. Thus the infrared section may be tested using this effect.
|
