Memory card tester.

摘要

Disclosed is a method and apparatus for testing a memory card (50'). The memory card (50') includes a plurality of storage locations which store data bits and ECC check bits. On the storage controller associated with the memory card (50') under test are provided means (420) for generating a test data pattern and input ECC logic (110) and output ECC logic (160). On reading the test data pattern into the storage locations ECC check bits are generated which are stored in the ECC bit array (140). On reading out the test data pattern, the ECC check bits are used to see whether any error has occurred in the data bits and, if so, this is signalled (ECC_SE; ECC_UCE). The method and apparatus further includes means (370) to step through all the addresses in the memory card (50') under test so that a complete test may be carried out at system speed. On completion of the test, the occurrence of any errors and their location within the memory card (50') may be read from provided registers.