| 摘要 |
PURPOSE:To obtain a printing inspection method capable of reducing excessive detection without outputting the defect data of the blank part of printed matter of the same pattern by storing master pattern data and comparing and collating the read mask pattern data and pattern data to be inspected each other. CONSTITUTION:A visual unit 2 picks up the image of the printing surface of printed matter P with the start of seal printing and obtains the image data to be inspected having the voltage level corresponding to the density data incident on the light detecting part 3 of the unit 2. The contour data extracted from the image data by a contour extracting circuit 16 is supplied to a pattern comparison circuit 15 as pattern data to be inspected through a timing circuit 18 and, in synchronous relation to this operation, master pattern data is read from a master memory 14 by the pattern comparison circuit 5 Therefore, both pattern data are mutually compared and collated in the pattern comparison circuit 15. |
