发明名称 INDIVIDUALIZATION OF CHIP FROM WAFER
摘要 <p>PURPOSE: To provide a simplified method for easily individualizing chips from a wafer, with a standard IC manufacturing installation for silicon treatment technique, especially in a silicon wafer. CONSTITUTION: Trenches 7 are formed between chips 3 by etching an SOI substrate as far as an insulating layer 2. Spacers 6 are formed in order to make SiO2 layers 4 of the chips inert. Chips are individualized by etching and eliminating the insulating layer 2.</p>
申请公布号 JPH0774130(A) 申请公布日期 1995.03.17
申请号 JP19940135219 申请日期 1994.05.25
申请人 SIEMENS AG 发明人 FURANTSU NEPURU
分类号 H01L21/301;H01L21/78;(IPC1-7):H01L21/301 主分类号 H01L21/301
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