发明名称 Method of manufacturing thin film transistor
摘要 In a method of manufacturing a thin film transistor, when impurity ions are introduced in a channel region between source and drain regions in a semiconductor layer, an insulator layer is first formed on the semiconductor layer. Then, impurity ions generated on high frequency discharge are introduced through the insulator layer into the semiconductor layer under a specified acceleration voltage. Then, the introduction depth of impurities and the amount of the impurities to be introduced in the channel region can be controlled or the threshold voltage of the thin film transistor can be controlled. This method can be applied to a large substrate.
申请公布号 US5397718(A) 申请公布日期 1995.03.14
申请号 US19930019682 申请日期 1993.02.19
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 FURUTA, MAMORU;KAWAMURA, TETSUYA;YOSHIOKA, TATSUO;SANO, HIROSHI;MIYATA, YUTAKA
分类号 H01L21/3215;H01L21/336;H01L29/786;(IPC1-7):H01L21/265 主分类号 H01L21/3215
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