| 摘要 |
<p>An apparatus for measuring the magnetocrystalline anisotropy in intense magnetic fields is provided; the apparatus features a first electric circuit (1) that can generate a first pulsed magnetic field fit for magnetising a sample of ferromagnetic or ferrimagnetic polycrystalline material (31) and a second electric circuit (2) that can generate a second pulsed magnetic field with a peak value that substantially corresponds to a maximum value of the first magnetic field, so that it will bring in the sample (31) a magnetisation of such intensity that it will give out, through a transducer (26) and an operational derivative circuit (35), a precise measure of magnetocrystalline anisotropy in the sample material (31) with high values of anisotropy. (Fig. 1).</p> |
