发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND FABRICATING METHOD THEREOF |
摘要 |
The method includes the steps of ; a 1st insulating film (9) for a transistor ; exposing the source region (3) of transistor to form and etch a 1st conducting layer and a 2nd insulating film thereon by using a first mask pattern to reoexpose the region (3) ; etching the substrate to form a trench (20) to remove the mask pattern and insulating film ; forming and etching-back and forming a 2nd conducting layer (15) to form a storage electrode used as a 1st electrode of capacitor ; thereby connecting between the storage electrode of capacitor and the source region of transistro by using the connecting layer.
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申请公布号 |
KR950002033(B1) |
申请公布日期 |
1995.03.08 |
申请号 |
KR19910020631 |
申请日期 |
1991.11.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON, KI - WON;KANG, CHANG - SOK;KIM, YONG - UK |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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