发明名称 SEMICONDUCTOR MEMORY DEVICE AND FABRICATING METHOD THEREOF
摘要 The method includes the steps of ; a 1st insulating film (9) for a transistor ; exposing the source region (3) of transistor to form and etch a 1st conducting layer and a 2nd insulating film thereon by using a first mask pattern to reoexpose the region (3) ; etching the substrate to form a trench (20) to remove the mask pattern and insulating film ; forming and etching-back and forming a 2nd conducting layer (15) to form a storage electrode used as a 1st electrode of capacitor ; thereby connecting between the storage electrode of capacitor and the source region of transistro by using the connecting layer.
申请公布号 KR950002033(B1) 申请公布日期 1995.03.08
申请号 KR19910020631 申请日期 1991.11.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, KI - WON;KANG, CHANG - SOK;KIM, YONG - UK
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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