发明名称 |
Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part |
摘要 |
An eddy current probe array is disclosed comprising a plurality of spatially correlated eddy current probe elements sufficiently disposed within a flexible interconnecting structure to collect a discrete plurality of spatially correlated eddy current measurements for nondestructive near surface flaw detection. A plurality of precisely fabricated, substantially identical elements being sufficiently distributed can accommodate inspecting an area of conductor covered by the active width of the array in a single uni-directional scan. The array structure can flexibly conform to accommodate inspection of large, irregular, curved conductive surfaces which cannot be inspected by conventional means.
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申请公布号 |
US5389876(A) |
申请公布日期 |
1995.02.14 |
申请号 |
US19910696455 |
申请日期 |
1991.05.06 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
HEDENGREN, KRISTINA H. V.;MCCARY, RICHARD O.;ALLEY, ROBERT P.;CHARLES, RICHARD J.;KORNRUMPF, WILLIAM P.;YOUNG, JOHN D. |
分类号 |
G01N27/90;(IPC1-7):G01N27/82;G01R33/12 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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