| 摘要 |
A fast time base generator for an automatic test system comprises a generator of fast address configurations (30) and a divider circuit (32) which divides the fast address configurations into a set of slower address configurations, a local generator circuit (15) which comprises a set of signal generating circuits operating at the lower frequency of the slower address configurations so as to provide signals of lower frequency, and a fast format generator (66) which uses the signals of lower frequency in order to furnish a signal of high frequency which is applied to a device under test (21). <IMAGE> |
