Driver circuits for IC testing devices

摘要

Driver circuits are proposed which furthermore serve as a termination network and as a terminal in a testing device for integrated circuits. When one port of a test specimen is to be driven between two predetermined voltage levels, the input/output terminal of the driver is switched over between two predetermined voltage levels with an output impedance which is matched to the transmission line between the driver circuit and the test specimen. When the test-specimen port delivers an output signal, the driver circuit can be programmed in order to provide one of two types of networks. When the test-specimen port is specified as being capable of controlling the load, the transmission line between the driver circuit and the test specimen is closed off by switching the input/output terminal of the driver to a predetermined voltage level with an impedance of Z0. When the test-specimen port is not capable of doing this, the driver circuit functions as a Z-type terminal circuit.