发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To suppress the capacity drop of a capacitor by reducing the quantity of fluorine within a high-permitivity film, and preventing an increase in the thickness of an SiO2 film which arises at the interface with the electrode to become one electrode of the capacitor. CONSTITUTION:This manufacture comprises a process of growing a dielectric film and the oxide films of a semiconductor on a semiconductor substrate, next, a process of crystallizing the dielectric film by heat-treating the semiconductor substrate, and next, a process of removing the oxide film.
申请公布号 JPH0738061(A) 申请公布日期 1995.02.07
申请号 JP19930181761 申请日期 1993.07.23
申请人 FUJITSU LTD 发明人 KIMURA MASAMI;OTANI NARIMOTO
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L21/8246;H01L27/10;H01L27/105;H01L27/108 主分类号 H01L27/04
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