发明名称 Bake-stable HgCdTe photodetector and method for fabricating same.
摘要 <p>A photoresponsive device and a method of fabricating same, wherein the device includes semiconductor material, such as a cap region (14a), comprised of elements selected from Group IIB-VIA. A molybdenum contact pad (16) is formed upon a surface of the cap region, and a molybdenum ground contact pad is formed on a surface of a base region (12). A wide bandgap semiconductor passivation layer (20) overlies the surface of cap region and also partially overlies the molybdenum contact pad. A dielectric layer (22) overlies the passivation layer, and an indium bump (24) is formed upon the molybdenum contact pad. The indium bump extends upwardly from the molybdenum contact pad and through the dielectric layer. The dielectric layer is in intimate contact with side surfaces of the indium bump such that no portion of the molybdenum contact pad can be physically contacted from a top surface of the dielectric layer. The method eliminates the possibility of unwanted chemical reactions occurring between the In and the underlying contact pad metal. The method also deposits the contact metal before the deposition of the passivation and before a high temperature anneal, with windows to the contact being opened after the anneal so as to reduce localized stresses at the edges of the windows. &lt;IMAGE&gt;</p>
申请公布号 EP0635892(A1) 申请公布日期 1995.01.25
申请号 EP19930305794 申请日期 1993.07.22
申请人 SANTA BARBARA RESEARCH CENTER 发明人 COCKRUM,CHARLES A.;GESSWEIN,FRANCIS I.;SCHULTE,ERIC F.
分类号 H01L21/443;H01L21/471;H01L27/146;H01L31/103;(IPC1-7):H01L31/021;H01L31/18;H01L31/022 主分类号 H01L21/443
代理机构 代理人
主权项
地址