SUPERHARD TIPS FOR MICRO-PROBE MICROSCOPY AND FIELD EMISSION

摘要

Forming micro-probe tips for an atomic force microscope, a scanning tunneling microscope, a beam electron emission microscope, or for field emission, by first thinning a tip (11) of a first material, such as silicon. The tips (11) are then reacted with a second material, such as atoms from an organic or ammonia vapor, at a temperature of about 1000 DEG C +/- 200 DEG C and vacuum conditions for several minutes. Vapors such as methane, propane or acetylene will be converted to SiC or WC while ammonia will be converted to Si3N4. The converted material will have different physical, chemical and electrical properties. For example, a SiC tip will be superhard, approaching diamond in hardness. Electrically conductive tips are suitable for field emission.