发明名称 TEST METHOD FOR ADDRESS DECODER OF ROM
摘要 <p>PURPOSE:To obtain a test method of the address decoder of a ROM for testing the address decoder of the ROM having different contents with a same test method without neccessiating an expected value pattern so as to eliminate a troublesomeness making expected value patterns at every content of ROM data. CONSTITUTION:In the test method of the address decoder 12 of the ROM, a specific address is applied to a ROM 10 and data of the address are read-out to be written in a RAM 20. Next, an address is changed to be inputted to the ROM 10 and accessed to other data, an address is returned to the original specific address and then data corresponding to this address are read-out. The read-out data are compared with data written in the RAM 20. When data coincide in a compared result, the address decoder 12 is judged to be normal.</p>
申请公布号 JPH0721800(A) 申请公布日期 1995.01.24
申请号 JP19930159812 申请日期 1993.06.30
申请人 OKI ELECTRIC IND CO LTD 发明人 SHINOZUKA HIROSHI;GOTO HIROSHI
分类号 G06F11/08;G11C17/00;G11C29/00;G11C29/56;(IPC1-7):G11C29/00 主分类号 G06F11/08
代理机构 代理人
主权项
地址
您可能感兴趣的专利