发明名称 Contact structure for connecting an electrode to a semiconductor
摘要 A contact structure for connecting a semiconductor device to a wiring electrode includes a semiconductor layer forming a part of the semiconductor device. A first contact layer of reduced resistivity covers a surface of the semiconductor layer. An insulating structure is provided on the first contact layer so as to bury the first contact layer underneath. A penetrating hole is opened through the insulating structure so as to expose a part of the first contact layer. A second contact layer of reduced resistivity is provided on the part of the first contact layer exposed by the penetrating hole. The second contact layer extends from a bottom of the penetrating hole along its side wall. A conductor layer forms the wiring electrode provided on the second contact layer.
申请公布号 US5384485(A) 申请公布日期 1995.01.24
申请号 US19930115242 申请日期 1993.08.18
申请人 FUJITSU LIMITED 发明人 NISHIDA, KENJI;SATO, NORIAKI
分类号 H01L29/43;H01L21/28;H01L21/285;H01L21/336;H01L21/60;H01L23/485;H01L23/532;(IPC1-7):H01L23/48;H01L29/76;H01L23/52;H01L29/40 主分类号 H01L29/43
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