发明名称 MOLECULAR BEAM INTENSITY MONITOR
摘要 PURPOSE:To eliminate influence due to re-evaporation of an adhered substance and to measure molecular beam intensity accurately by providing a heating means at a part where heat from the filament of an ionization vacuum meter directly arrives and then re-evaporating the substance which is adhered to that part in advance. CONSTITUTION:A heater 11 is installed in a wall part 22 of an enclosure 2 where an ionization vacuum meter 3 is laid out inside. It is desirable to use a non-induction coil for the heater 16 so that another measurement may not be affected. Molecular beams coming from a cell pass through an opening 21 of the enclosure 2 and then reaches the vacuum meter 3. However, since the molecular beams have a certain degree of spread, a thin film (substance) is adhered also to each part of the enclosure 2 and an adjacent manipulator 6. The heater 16 heats a part at which the heat of a filament 31 of the vacuum meter 3 directly arrives, namely the surface of the enclosure 2 or the adjacent manipulator 6 to reevaporate the thin film, thus eliminating the influence for the indication value of the vacuum meter 3.
申请公布号 JPH06347554(A) 申请公布日期 1994.12.22
申请号 JP19930137395 申请日期 1993.06.08
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KARASAWA TAKESHI;MITSUYU TSUNEO
分类号 C30B23/08;G01L21/30;G01T1/16;G01T7/00;H01L21/203;(IPC1-7):G01T1/16 主分类号 C30B23/08
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