发明名称 |
MOLECULAR BEAM INTENSITY MONITOR |
摘要 |
PURPOSE:To eliminate influence due to re-evaporation of an adhered substance and to measure molecular beam intensity accurately by providing a heating means at a part where heat from the filament of an ionization vacuum meter directly arrives and then re-evaporating the substance which is adhered to that part in advance. CONSTITUTION:A heater 11 is installed in a wall part 22 of an enclosure 2 where an ionization vacuum meter 3 is laid out inside. It is desirable to use a non-induction coil for the heater 16 so that another measurement may not be affected. Molecular beams coming from a cell pass through an opening 21 of the enclosure 2 and then reaches the vacuum meter 3. However, since the molecular beams have a certain degree of spread, a thin film (substance) is adhered also to each part of the enclosure 2 and an adjacent manipulator 6. The heater 16 heats a part at which the heat of a filament 31 of the vacuum meter 3 directly arrives, namely the surface of the enclosure 2 or the adjacent manipulator 6 to reevaporate the thin film, thus eliminating the influence for the indication value of the vacuum meter 3.
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申请公布号 |
JPH06347554(A) |
申请公布日期 |
1994.12.22 |
申请号 |
JP19930137395 |
申请日期 |
1993.06.08 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KARASAWA TAKESHI;MITSUYU TSUNEO |
分类号 |
C30B23/08;G01L21/30;G01T1/16;G01T7/00;H01L21/203;(IPC1-7):G01T1/16 |
主分类号 |
C30B23/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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