发明名称 USING METHOD FOR NONVOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PURPOSE:To prevent a non-selected cell from bring made to be a weak writing state while preventing erroneous writing. CONSTITUTION:The voltage -7V is applied to a word line W1, 5B to a bit line B1 and a word line W2 and OV to others. As to a non-selected cell C12, since 5V is applied to its control gate electrode, electrons are not pulled back to the drain. Since OV is applied to the source line S, a side wall becomes grouded potential and a channel region is in a non-conductive state. Consequently, the portion between the drain and the source of the cell 12 is in the non- conductive state and the voltage applied to the bit line B1 is not transferred to the source of other non-conductive cell C21. Consequently, the non-conductive cell C12 is prevented from becoming the weak writing state.</p>
申请公布号 JPH06333397(A) 申请公布日期 1994.12.02
申请号 JP19930119859 申请日期 1993.05.21
申请人 ROHM CO LTD 发明人 SHIMOJI NORIYUKI
分类号 G11C17/00;G11C16/02;G11C16/04;G11C16/06;H01L21/8247;H01L27/10;H01L29/788;H01L29/792;(IPC1-7):G11C16/06 主分类号 G11C17/00
代理机构 代理人
主权项
地址