发明名称 HIGH RELIABILITY DATA OUTPUT CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT USING DATA OUTPUT METHOD
摘要 <p>PURPOSE: To obtain a data output expanding method which can output effective data for a longer time in its page mode, etc., and enhance reliability in a semiconductor integrated circuit. CONSTITUTION: An output line of a data input/output line sense amplifier 200 is provided with a latch circuit 300, and also an input side of a data output buffer 500 is provided with a switch means 400 which is operated by a control signal whose output level is decided according to level conversion of signal bars RAS and CAS. The switch means 400 is turned on when the signal bar CAS is in an active state and turned off when the bar CAS is in a precharge state. Because an input of cell data to the buffer 500 by a noneffective column address which follows an effective column address is cut off owing to a nonconducting state of the means 400, the buffer 500 can maintain an effective data output of a previous cycle until the signal bar CAS is in an active state of the next cycle.</p>
申请公布号 JPH06333393(A) 申请公布日期 1994.12.02
申请号 JP19940098601 申请日期 1994.05.12
申请人 SAMSUNG ELECTRON CO LTD 发明人 BOKU JIYUNKEI
分类号 G11C11/409;G11C7/10;G11C11/401;G11C11/407;(IPC1-7):G11C11/409 主分类号 G11C11/409
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