发明名称 X-ray image intensifier having an image sensor with amorphous semiconductor material layer
摘要 The invention is directed to an x-ray image intensifier having an evacuated housing, an input luminescent screen, electron optics, and an image sensor applied inside the housing at that side thereof lying opposite the input luminescent screen. The side of the image sensor facing toward the input luminescent screen is provided with a layer system that includes at least one semiconductor layer that effects an electron conversion of the incident electrons by ionization with charge carrier multiplication and is composed of amorphous semiconductor material.
申请公布号 US5365056(A) 申请公布日期 1994.11.15
申请号 US19930084139 申请日期 1993.07.01
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SKLEBITZ, HARTMUT;MATTERN, DETLEF;HOHEISEL, MARTIN
分类号 H01J29/45;H01J31/50;H01L27/146;H01L27/148;H04N5/225;H04N5/32;(IPC1-7):H01J40/14 主分类号 H01J29/45
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