发明名称 METHOD AND DEVICE FOR FAULT DIAGNOSIS
摘要 <p>PURPOSE:To detect abnormality correctly at all times without any misdiagnosis, and to specify an abnormal position speedily and automate the generation of an input signal list for the abnormal position specification when the abnormality is detected. CONSTITUTION:The state of the actual signal of a controller, the order of its transition, and the transition time are compared with reference data for abnormality decision making to detect abnormality of the output signal. Once the abnormality is detected, the state of the actual input signal of the controller is compared with the state of the input expected signal of reference data for abnormality place detection to specify the place where the abnormality is caused in relation to the input signal. The list of input signals regarding the reference data for abnormality decision making is generated by extracting the input signals from a program part which determines respective output signals regarding the reference data for abnormality decision making.</p>
申请公布号 JPH06314117(A) 申请公布日期 1994.11.08
申请号 JP19930124753 申请日期 1993.04.30
申请人 OMRON CORP 发明人 NISHIDAI HAJIME;IRIE ATSUSHI;SOMA KOJI;TABATA HISAHIRO
分类号 G01R31/00;G05B23/02;(IPC1-7):G05B23/02 主分类号 G01R31/00
代理机构 代理人
主权项
地址