| 摘要 |
PURPOSE:To allow easy measurement of luminance even under the state of wafer while achieving sharp luminance characteristics by setting the end face of each electrode at a specific position from the side face of a substrate and making a window in each electrode. CONSTITUTION:The LED comprises a plurality of emission regions 4 arranged on the surface of a compound semiconductor substrate 1 while exposing to the side face thereof, and a plurality of electrodes 6 arranged on the surface of the substrate 1 while coming into ohmic contact with each emission region 4. The end face of each electrode 6 is located within 20mum from the side face of the substrate 1 and each electrode 6 is provided with a window 10 for partially exposing the surface of each emission region 4. Consequently, the leakage of light from the surface to the side face is suppressed and the luminance characteristics are sharpened on the side face. Furthermore, the luminance can be measured on the surface side even under the state of wafer through the window 10 made in the electrode 6 such that the surface of the emission region 4 is partially exposed. |
