发明名称 |
Arrangement for measuring small capacitances |
摘要 |
The invention relates to an arrangement for measuring small capacitances, a capacitance to be measured being the frequency-determining element of an oscillator, and it being possible to take the capacitance-dependent output signal from a subtractor. In order to produce a measuring arrangement in which the linearity of the measurement result is guaranteed, at least one oscillator (7), the frequency of which is indirectly proportional to the capacitance (10, 11), is connected via a resonant circuit (8) to a matching circuit (9) which is connected to the subtractor (14). <IMAGE>
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申请公布号 |
DE4313327(A1) |
申请公布日期 |
1994.10.27 |
申请号 |
DE19934313327 |
申请日期 |
1993.04.23 |
申请人 |
VDO ADOLF SCHINDLING AG, 60487 FRANKFURT, DE |
发明人 |
KERN, WOLFRAM, O-3027 MAGDEBURG, DE |
分类号 |
G01D5/243;G01R27/26;H03B5/24;(IPC1-7):G01R27/26;H03B5/08 |
主分类号 |
G01D5/243 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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