发明名称 Plasma diagnosing apparatus
摘要 PCT No. PCT/JP91/01568 Sec. 371 Date Jul. 15, 1992 Sec. 102(e) Date Jul. 15, 1992 PCT Filed Nov. 15, 1991 PCT Pub. No. WO92/09185 PCT Pub. Date May 29, 1992.A plasma diagnosing apparatus for performing plasma diagnosis witch probes having a high degree of cleanliness by removing contamination caused by reactive plasma, etc., while quantitatively detecting a degree of the contamination of the probes. The disclosed apparatus avoids the disadvantages of conventional apparatuses, in which the voltage-current characteristics of the probes are deteriorated by growth of the contaminant film formed on the probes, making it difficult to measure the parameters of the plasma conditions.
申请公布号 US5359282(A) 申请公布日期 1994.10.25
申请号 US19920910143 申请日期 1992.07.15
申请人 NICHIMEN KABUSHIKI KAISHA;NIHON KOSYUHA KABUSHIKI KAISHA 发明人 TEII, SHINRIKI;SHINOHARA, KIBATSU;OBARA, KOZO;UMEZAWA, TSUKU
分类号 H05H1/00;(IPC1-7):G01N27/06 主分类号 H05H1/00
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