发明名称 |
Plasma diagnosing apparatus |
摘要 |
PCT No. PCT/JP91/01568 Sec. 371 Date Jul. 15, 1992 Sec. 102(e) Date Jul. 15, 1992 PCT Filed Nov. 15, 1991 PCT Pub. No. WO92/09185 PCT Pub. Date May 29, 1992.A plasma diagnosing apparatus for performing plasma diagnosis witch probes having a high degree of cleanliness by removing contamination caused by reactive plasma, etc., while quantitatively detecting a degree of the contamination of the probes. The disclosed apparatus avoids the disadvantages of conventional apparatuses, in which the voltage-current characteristics of the probes are deteriorated by growth of the contaminant film formed on the probes, making it difficult to measure the parameters of the plasma conditions.
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申请公布号 |
US5359282(A) |
申请公布日期 |
1994.10.25 |
申请号 |
US19920910143 |
申请日期 |
1992.07.15 |
申请人 |
NICHIMEN KABUSHIKI KAISHA;NIHON KOSYUHA KABUSHIKI KAISHA |
发明人 |
TEII, SHINRIKI;SHINOHARA, KIBATSU;OBARA, KOZO;UMEZAWA, TSUKU |
分类号 |
H05H1/00;(IPC1-7):G01N27/06 |
主分类号 |
H05H1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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