发明名称 POTENTIAL MEASURING APPARATUS
摘要 PURPOSE:To perform potential measurement in a high resolution. CONSTITUTION:At the part facing at least a potential measuring surface 2, a conductive measuring probe 1 having an insulating material 1a, a dummy electrode 4, which is electrically conducted with the measuring probe 1, and a surface potentiometer 5, which measures the potential generated at the dummy electrode 4 when the measuring probe 1 comes into contact with the potential measuring surface 2 through the insulating material 1a, are provided. The insulating material 1a is constituted of a low friction member.
申请公布号 JPH06289083(A) 申请公布日期 1994.10.18
申请号 JP19930075859 申请日期 1993.04.01
申请人 RICOH CO LTD 发明人 KATO TOMOKI;KADONAGA MASAFUMI;TAKAHASHI TOMOKO
分类号 G01R19/00;G01R29/12;G03G15/00 主分类号 G01R19/00
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