| 发明名称 |
METHOD OF MEASURING ARTIFACT TAPER |
| 摘要 |
A method of measuring artifact (12) taper by calculating angular orientations with respect to three locus points (30, 32 and 34) and including the steps of sequentially positioning (36, 38 and 40) the surfaces (50) defining the taper with respect to said three points and repeating this procedure from different positions of said artifact. |
| 申请公布号 |
WO9421985(A1) |
申请公布日期 |
1994.09.29 |
| 申请号 |
WO1994US03043 |
申请日期 |
1994.03.21 |
| 申请人 |
GENERAL SIGNAL CORPORATION |
发明人 |
FLEIG, JON, F.;TRONOLONE, MARK, J.;HUANG, CHUNSHENG |
| 分类号 |
G01B11/03;G01B11/26;(IPC1-7):G01B11/03 |
主分类号 |
G01B11/03 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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