MASK-PROGRAMMED INTEGRATED CIRCUITS HAVING TIMING AND LOGIC COMPATIBILITY TO USER-CONFIGURED LOGIC ARRAYS

摘要

Method and apparatus for producing mask-configured integrated circuits which are pin, logic, and timing compatible substitutes for user-configured logic arrays (10), without the need for logic or timing simulations of the mask-configured circuit design. Scan testing networks of test blocks and modified flip-flops are included in the mask-configured substitutes to test functionality. Logic compatibility to the user-configured logic array (an FPGA) (10) is preserved by clustering together in the mask-configured integrated circuit (a gate array) (16) all of the logic gates which perform the functions of a particular FPGA logic block. Moreover, only those FPGA logic gates or functions which are used are replicated in the gate array, to conserve chip area.