发明名称 Magnetic field enhanced plasma processing chamber
摘要 A plasma etch reactor comprising a remote source of plasma mounted on a vacuum processing chamber has a large permanent magnet ring around the area of the chamber where the plasma enters, magnetically oriented so that magnetic field lines are removed from said plasma in the processing chamber, and two or more pairs of magnet rings mounted around said chamber to form a series of magnetic cusps about the wall of said chamber, to thereby inhibit plasma electrons from striking the wall of said chamber. A substrate entry port can be fitted between the magnet rings, allowing automatic ingress and egress of said substrates with maximum efficiency.
申请公布号 US5346579(A) 申请公布日期 1994.09.13
申请号 US19930093445 申请日期 1993.07.19
申请人 APPLIED MATERIALS, INC. 发明人 COOK, JOEL M.;TROW, JOHN R.
分类号 H01L21/302;H01J37/32;H01L21/3065;H05H1/46;(IPC1-7):H01L21/00 主分类号 H01L21/302
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