| 摘要 |
<p>The present method of manufacturing provides improved accuracy inthe measurement and tuning of select parameters of electronic devices. The electronic components are assembled (10) on an assemblyline and tested by test stations (18, 22, 24, 26) wherein each test station is monitored by a control system (34). The method compares (108) slave station test performance to a master test station with feedback of the differences to the slave test station, thereby forcing it to emulate the master test station in future testing. The method further involves the monitoring (34) of assembled device quality. If the quality deteriorates, the control system can automatically change component selection (40) or contact a human operator (38). The control system automatically records the entire assembly line process to provide inventory control and an assembly history of each device for repair and assembly line process modification. Additionnaly, the control system monitors the entire assembly line for analysis and constraint (36) of preselected parameters such as production rate and product quality.</p> |
