Fremgangsmåde til kalibrering af et atomic force mikroskop,申请号DK19930000177-传众专利搜索

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发明名称	Fremgangsmåde til kalibrering af et atomic force mikroskop
摘要
申请公布号	DK17793(A)	申请公布日期	1994.08.17
申请号	DK19930000177	申请日期	1993.02.16
申请人	MIKROELEKTRONIK CENTRET	发明人	JENSEN, FLEMMING
分类号	G01B21/30;G02B7/34;(IPC1-7):G02B7/34	主分类号	G01B21/30
代理机构		代理人
主权项
地址

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