发明名称 ERROR DETECTION CIRCUIT
摘要 An input data signal header is compared, in parallel, by a plurality of comparing means (100, 200, 300, 400) with respective predetermined bit patterns. If more than a preset number of mismatches occur during each comparison, the relevant comparing means (100, 200, 300, 400) outputs an error detect signal. If all the comparing means output an error detect signal, a gate circuit (2000) blocks the transfer of the input data signal therethrough. <IMAGE>
申请公布号 EP0577411(A3) 申请公布日期 1994.08.10
申请号 EP19930305122 申请日期 1993.06.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, HONG SOO
分类号 H04N7/083 主分类号 H04N7/083
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