发明名称 INTERFEROMETRIC MEASUREMENT DEVICE
摘要 Two input beams (10, 20) of an interferometric measurement device produced by integrated optics technology are widened to form two spread flat beams producing an interference pattern (30). Two sensors (15, 25) deliver two measurement signals, preferably in phase quadrature, representative of two points on the interference plane.
申请公布号 WO9414028(A1) 申请公布日期 1994.06.23
申请号 WO1993FR01194 申请日期 1993.12.06
申请人 MERLIN GERIN;KEVORKIAN, ANTOINE;DUPORT-SCHANEN, ISABELLE;BENECH, PIERRE 发明人 KEVORKIAN, ANTOINE;DUPORT-SCHANEN, ISABELLE;BENECH, PIERRE
分类号 G01B9/02;G02B6/12;G02B6/122 主分类号 G01B9/02
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