发明名称 |
CORRECTION METHOD FOR INSTRUCTION DATA IN MOUNTED PART INSPECTION DEVICE |
摘要 |
PURPOSE:To reduce the work load of an operator by efficiently performing the correction work of data for inspection. CONSTITUTION:A substrate name objecting correction teaching is firstly registered. When a reference substrate with good installation quality is introduced in an mounted part inspection device and an inspection command is input, test inspection is performed and the result is output (ST 1 to 4). As for parts judged no good in mounting quality, index information is set in a memory region specified in a memory. A control part refers to the index information and searches only parts judged no good in turn. An operator corrects the data each inspection (step 5 to 8). |
申请公布号 |
JPH06160043(A) |
申请公布日期 |
1994.06.07 |
申请号 |
JP19920330978 |
申请日期 |
1992.11.16 |
申请人 |
OMRON CORP |
发明人 |
ISHIBANE MASATO;YAMAMOTO NORIHITO |
分类号 |
G01B11/24;G01N21/88;G01N21/93;G01N21/956;H01L21/66;H05K3/34;H05K13/08 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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