发明名称 CORRECTION METHOD FOR INSTRUCTION DATA IN MOUNTED PART INSPECTION DEVICE
摘要 PURPOSE:To reduce the work load of an operator by efficiently performing the correction work of data for inspection. CONSTITUTION:A substrate name objecting correction teaching is firstly registered. When a reference substrate with good installation quality is introduced in an mounted part inspection device and an inspection command is input, test inspection is performed and the result is output (ST 1 to 4). As for parts judged no good in mounting quality, index information is set in a memory region specified in a memory. A control part refers to the index information and searches only parts judged no good in turn. An operator corrects the data each inspection (step 5 to 8).
申请公布号 JPH06160043(A) 申请公布日期 1994.06.07
申请号 JP19920330978 申请日期 1992.11.16
申请人 OMRON CORP 发明人 ISHIBANE MASATO;YAMAMOTO NORIHITO
分类号 G01B11/24;G01N21/88;G01N21/93;G01N21/956;H01L21/66;H05K3/34;H05K13/08 主分类号 G01B11/24
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