| 摘要 |
<p>PURPOSE:To test a row decoder by preparing only one kind of a test pattern and to improve efficiency by providing a memory cell array section for testing the row recorder. CONSTITUTION:A memory cell array section 29 for testing a row decoder which shares word lines WL0 to WL7 with a memory cell array section 1 for users is provided. And a drain of an only Tr 317 of which a gate is connected to a word line WL7 corresponding to a NAND circuit 67 out of memory cell transistors (Tr) 310-317 is connected to a test line 30. Therefore, the circuit 6 can be tested by transiting addresses A5-A0 so that the Tr 317 and every other one Tr are alternately selected about Tr 310-317 and reading out data for test stored in the section 29. That is, if one kind test pattern stored in the section 29 is prepared independently of data for users stored in the section 1, since the circuit 67 can be tested, efficiency for testing a row decoder can be improved.</p> |
