发明名称 |
X-ray examining device. |
摘要 |
<p>For an X-ray examining device, having a sensor matrix (21) with sensors (1) which are arranged in rows and columns and each have an X-ray- sensitive photo-sensor element (11) and an energy storage capacitor (12) connected in parallel therewith, and which are connected in each case by means of first electrodes to a counter-electrode (2) to which a DC voltage is applied, and by means of second electrodes to an electrical switch (13) per sensor, it is provided in order to measure the exposure that, once the electrical switch (13) has been closed briefly, and before the charges are read out, the currents flowing through the counter-electrode(s) (2) and/or through the electrical switches (13) are used while carrying out an X-ray exposure to measure and/or correct the exposure. <IMAGE> </p> |
申请公布号 |
EP0486102(B1) |
申请公布日期 |
1994.05.18 |
申请号 |
EP19910202931 |
申请日期 |
1991.11.12 |
申请人 |
PHILIPS PATENTVERWALTUNG GMBH;N.V. PHILIPS' GLOEILAMPENFABRIEKEN |
发明人 |
SCHIEBEL, ULRICH, DR.;WIECZOREK, HERFRIED, DR.;MEULENBRUGGE, HENDRIK |
分类号 |
H05G1/44;H05G1/64;(IPC1-7):H05G1/44;G01N23/04;G01T1/29 |
主分类号 |
H05G1/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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